Redundancy array column decoder for memory

ABSTRACT

Methods, systems, and apparatuses for redundancy in a memory array are described. A memory array may include some memory cells that are redundant to other memory cells of the array. Such redundant memory cells may be used if a another memory cell is discovered to be defective in some way; for example, after the array is fabricated and before deployment, defects in portions of the array that affect certain memory cells may be identified. Memory cells may be designated as redundant cells for numerous other memory cells of the array so that a total number of redundant cells in the array is relatively small fraction of the total number of cells of the array. A configuration of switching components may allow redundant cells to be operated in a manner that supports redundancy for numerous other cells and may limit or disturbances to neighboring cells when accessing redundancy cells.

CROSS REFERENCE

The present Application for Patent is a divisional of U.S. patentapplication Ser. No. 15/258,852 by Vimercati et al., entitled“Redundancy Array Column Decoder for Memory,” filed Sep. 7, 2016, nowU.S. Pat. No. 9,779,796, issued Oct. 3, 2017, assigned to the assigneehereof, and is expressly incorporated by reference in its entiretyherein.

BACKGROUND

The following relates generally to memory devices and more specificallyto redundancy array column decoder for non-volatile memory, such asferroelectric memory.

Memory devices are widely used to store information in variouselectronic devices such as computers, wireless communication devices,cameras, digital displays, and the like. Information is stored byprogramming different states of a memory device. For example, binarydevices have two states, often denoted by a logic “1” or a logic “0.” Inother systems, more than two states may be stored. To access the storedinformation, the electronic device may read, or sense, the stored statein the memory device. To store information, the electronic device maywrite, or program, the state in the memory device.

Various types of memory devices exist, including random access memory(RAM), read only memory (ROM), dynamic RAM (DRAM), synchronous dynamicRAM (SDRAM), ferroelectric RAM (FeRAM), magnetic RAM (MRAM), resistiveRAM (RRAM), flash memory, and others. Memory devices may be volatile ornon-volatile. Non-volatile memory, e.g., flash memory, can store datafor extended periods of time even in the absence of an external powersource. Volatile memory devices, e.g., DRAM, may lose their stored stateover time unless they are periodically refreshed by an external powersource. A binary memory device may, for example, include a charged ordischarged capacitor. A charged capacitor may, however, becomedischarged over time through leakage currents, resulting in the loss ofthe stored information. Certain features of volatile memory may offerperformance advantages, such as faster read or write speeds, whilefeatures of non-volatile memory, such as the ability to store datawithout periodic refreshing, may be advantageous.

FeRAM may use similar device architectures as volatile memory but mayhave non-volatile properties due to the use of a ferroelectric capacitoras a storage device. FeRAM devices may thus have improved performancecompared to other non-volatile and volatile memory devices. In certainFeRAM designs (among other design types), components of cells mayprocessed or manufactured, with non-ideal or undesirable characteristicsor communications that renders the cells or other components unusable.Building redundancy into an array may help mitigate some of theseissues, and may avoid a need to abandon an entire array, but redundantcells or components that go unused may be an inefficient use of valuabledie area.

BRIEF DESCRIPTION OF THE DRAWINGS

Example embodiments of the present disclosure are described withreference to the following figures:

FIG. 1 illustrates an example memory array that supports a redundancyarray column decoder for memory in accordance with embodiments of thepresent disclosure;

FIG. 2 illustrates an example circuit of a memory cell that supports aredundancy array column decoder for memory in accordance withembodiments of the present disclosure;

FIG. 3 illustrates example hysteresis curves for a ferroelectric memorycell that supports a redundancy array column decoder for memory inaccordance with embodiments of the present disclosure;

FIG. 4 illustrates an example of a memory array and other componentsthat support a redundancy array column decoder for memory in accordancewith embodiments of the present disclosure;

FIG. 5 illustrates an example of a digit line and other components thatsupports redundancy array column decoder for memory in accordance withembodiments of the present disclosure;

FIG. 6 illustrates an example of one or more relationships of a memoryarray and other components that supports redundancy array column decoderfor memory in accordance with embodiments of the present disclosure;

FIG. 7 illustrates an example of a memory array and other components ofa memory array that supports a redundancy array column decoder formemory in accordance with embodiments of the present disclosure;

FIG. 8 illustrates a memory array that supports a redundancy arraycolumn decoder for memory in accordance with embodiments of the presentdisclosure;

FIG. 9 illustrates a system, including a memory array, that supports aredundancy array column decoder for memory in accordance withembodiments of the present disclosure; and

FIGS. 10 and 11 are flowcharts that illustrate methods for a redundancyarray column decoder for memory in accordance with embodiments of thepresent disclosure.

DETAILED DESCRIPTION

In memory designs, when long traces or continuous portions of memoryelements are printed, the risk of unintentional defects increases.Building redundancy, such as a portion of the array with cells that areconnected in a way that offers redundancy to several other cells, mayhelp mitigate the problems due to manufacturing defects in way thatefficiently uses available die space.

By way of example, process or manufacturing defects may createoperational problems and may render parts of or whole memory arraysunusable. In some array designs, cell plates and other elements areclose together, and there is a risk of unintentional current and otherrelationships between cell plates, including, but not limited to,adjacent cell plates. Based on manufacturing or other actions, cellplates may have a current relationship with or other defects relative toneighboring cell plates. Such relationships or defects may weaken orprohibit performance of one or more of the cell plates. Examples ofsuch, relationships include shorts, parasitic fields or signals, and thelike.

Some cell plates may include vertically cut cell plates that may becommon among a small number of digit lines (e.g., 2 to 16) and arelatively large number of word lines (e.g., 512 to 1024). The manner inwhich cell plates are formed during manufacturing may affect arrayperformance. In some instances, because the distance between respectivecell plates is relatively narrow (e.g., like the distances betweendigits lines, word lines) then an electric current relationship mayexist between the cell plates. A current relationship (e.g., a short)between cell plates of a group may render the group, the section, orsome other memory elements inoperative. In some cases, the risk ofshorting between cells may cause manufacturers to employ expensivewholesale or local redundancies, or both; and the risk of suchdeficiencies may promote other, relatively complex solutions, includingmore robust design parameters (e.g., increasing spacing between plates).These alternatives increase costs and decrease memory design functionsand capabilities.

As described herein, memory arrays may be created and operated tomitigate risk of defects. For example, a redundancy group of cell platesmay be built into the memory array. If one or more of the cell platesare rendered unusable by one or more of the defects or relationshipsdescribed above, the memory array be configured to select the defectivecell plate's related redundant cell plate. An area on the memory arraymay be allocated to the redundant cell plates. Allocating space toredundant cell plates adds cost to producing the memory array. Asdescribed herein, a group of redundancy cell plates may be designed toreduce the amount of area occupied by the redundancy cell plates. Forexample, redundancy cell plates may be associated with multiple cellplates of the normal cell plate groups.

In addition, a memory array using FeRAM technology may be designed todecouple unselected memory cells, or regions of the memory from selectedmemory cells, cells plates, or regions during an access operation. Insome examples, undesired voltages or currents may result on unselectedmemory cells or unselected cell plates when another memory cell or cellplate is selected as part of an access operation. As described herein, aset of shunt control lines and shunt switching components may beconfigured to reduce biasing across unselected memory cells orunselected memory plates by grounding (or virtually grounding) theunselected elements of the memory array during an access operation. Insome embodiments, the redundancy cell plate group of a memory array mayalso include shunt switching components to isolate a cell plate of theredundancy group during an access operation. In some examples, theselection switching components may also be positioned on the shuntcontrol lines of the redundancy group. In this manner, additional areaof the memory array may be preserved.

Features of the disclosure introduced above are further described belowin the context of a memory array, and in other contexts. Specificembodiments are then described for cell plates, including vertically cutcell plates and the selection of cell plates and related operations,among others. These and other embodiments of the disclosure are furtherillustrated by and described with reference to apparatus diagrams,system diagrams, and flowcharts that relate to a redundancy array columndecoder for ferroelectric memory.

In the present disclosure, a cell plate and a plate are usedsynonymously, unless the specific embodiment or embodiments indicatesotherwise. In the present disclosure, a normal cell group may refer toportions of a memory array intended to be used as part of a normaloperation of the memory array when the array is manufactured withoutdefects, while a redundant cell group may refer to portions of a memoryarray designed to be a back-up cell group in case a normal cell group orcells of the normal cell group is defective.

FIG. 1 illustrates an example memory array 100 that supports aredundancy array column decoder for ferroelectric memory in accordancewith various embodiments of the present disclosure. In the disclosure,reference is made to ferroelectric memory for ease of comprehension andwithout limitation. It should be appreciated that various aspects of thedisclosure may also apply to other memory technologies. Memory array 100may also be referred to as an electronic memory apparatus. Memory array100 includes memory cells 105 that are programmable to store differentstates. Memory array 100 may include some cells 105 or a portion of thearray that is designated to be redundant to other cells 105 in thearray. If defects are identified in the array (e.g., as a result ofprocessing), then redundant cells 105 may be used instead of cells 105that have or are associated with the identified defects.

Each memory cell 105 may be programmable to store two states, denoted asa logic 0 and a logic 1. In some cases, memory cell 105 is configured tostore more than two logic states. A memory cell 105 may include acapacitor to store a charge representative of the programmable states;for example, a charged and uncharged capacitor may represent two logicstates, respectively. DRAM architectures may commonly use such a design,and the capacitor employed may include a dielectric material with linearelectric polarization properties. By contrast, a ferroelectric memorycell may include a capacitor that has a ferroelectric as the dielectricmaterial. Different levels of charge of a ferroelectric capacitor mayrepresent different logic states. Ferroelectric materials havenon-linear polarization properties; some details and advantages of aferroelectric memory cell 105 are discussed below.

Operations such as reading and writing may be performed on memory cells105 by activating or selecting the appropriate word line 110 and digitline 115. Word lines 110 may also be referred to as access lines anddigit lines 115 may also be referred to as bit lines. Activating orselecting a word line 110 or a digit line 115 may include applying avoltage to the respective line. Word lines 110 and digit lines 115 aremade of conductive materials. For example, word lines 110 and digitlines 115 may be made of metals (such as copper, aluminum, gold,tungsten, etc.), metal alloys, other conductive materials, or the like.According to the example of FIG. 1, each row of memory cells 105 isconnected to a single word line 110, and each column of memory cells 105is connected to a single digit line 115.

By activating one word line 110 and one digit line 115 (e.g., applying avoltage to the word line 110 or digit line 115), a single memory cell105 may be accessed at their intersection. Accessing the memory cell 105may include reading or writing the memory cell 105. The intersection ofa word line 110 and digit line 115 may be referred to as an address of amemory cell. In some embodiments, one or more read or write operationsmay be based on or derived from one or more selections of cell plates.

In some architectures, the logic storing device of a cell, e.g., acapacitor, may be electrically isolated from the digit line by aselection component. The word line 110 may be connected to and maycontrol the selection component. For example, the selection componentmay be a transistor and the word line 110 may be connected to the gateof the transistor. Activating the word line 110 results in an electricalconnection or closed circuit between the capacitor of a memory cell 105and its corresponding digit line 115. The digit line may then beaccessed to either read or write the memory cell 105.

Accessing memory cells 105 may be controlled through a row decoder 120and a column decoder 130. In some examples, a row decoder 120 receives arow address from the memory controller 140 and activates the appropriateword line 110 based on the received row address. Similarly, a columndecoder 130 receives a column address from the memory controller 140 andactivates the appropriate digit line 115. For example, memory array 100may include multiple word lines 110 and multiple digit lines 115. Thus,by activating a word line 110 and a digit line 115, the memory cell 105at their intersection may be accessed. As discussed herein, in variousembodiments, the address or location of one or more cells or cell platesmay affect identifications, determinations, or selections related tocell plates, among other elements or components. In some embodiments,the address or the location of memory cells may affect a selection, suchas a selection based on an absolute address or location or a relativeaddress or location. In some embodiments, the address or the location ofa memory cell and the existence of an electric current relationship mayaffect a selection of plate pairs, in cell plate group or across cellplate groups.

Upon accessing, a memory cell 105 may be read, or sensed, by sensecomponent 125 to determine the stored state of the memory cell 105. Forexample, after accessing the memory cell 105, the ferroelectriccapacitor of memory cell 105 may discharge onto its corresponding digitline 115. Discharging the ferroelectric capacitor may be based onbiasing, or applying a voltage, to the ferroelectric capacitor. Thedischarging may cause a change in the voltage of the digit line 115,which sense component 125 may compare to a reference voltage (not shown)in order to determine the stored state of the memory cell 105. Forexample, if digit line 115 has a higher voltage than the referencevoltage, then sense component 125 may determine that the stored state inmemory cell 105 was a logic 1 and vice versa. Sense component 125 mayinclude various transistors or amplifiers in order to detect and amplifya difference in the signals, which may be referred to as latching. Thedetected logic state of memory cell 105 may then be output throughcolumn decoder 130 as output 135.

A memory cell 105 may be set, or written, by activating the relevantword line 110 and digit line 115. As discussed above, activating a wordline 110 electrically connects the corresponding row of memory cells 105to their respective digit lines 115. By controlling the relevant digitline 115 while the word line 110 is activated, a memory cell 105 may bewritten—i.e., a logic value may be stored in the memory cell 105. Columndecoder 130 may accept data, for example input 135, to be written to thememory cells 105. A ferroelectric memory cell 105 may be written byapplying a voltage across the ferroelectric capacitor. This process isdiscussed in more detail below.

In some memory architectures, accessing the memory cell 105 may degradeor destroy the stored logic state and re-write or refresh operations maybe performed to return the original logic state to memory cell 105. InDRAM, for example, the capacitor may be partially or completelydischarged during a sense operation, corrupting the stored logic state.So the logic state may be re-written after a sense operation.Additionally, activating a single word line 110 may result in thedischarge of all memory cells in the row; thus, several or all memorycells 105 in the row may need to be re-written.

Some memory architectures, including DRAM, may lose their stored stateover time unless they are periodically refreshed by an external powersource. For example, a charged capacitor may become discharged over timethrough leakage currents, resulting in the loss of the storedinformation. The refresh rate of these so-called volatile memory devicesmay be relatively high, e.g., tens of refresh operations per second forDRAM arrays, which may result in significant power consumption. Withincreasingly larger memory arrays, increased power consumption mayinhibit the deployment or operation of memory arrays (e.g., powersupplies, heat generation, material limits, etc.), especially for mobiledevices that rely on a finite power source, such as a battery. Asdiscussed below, ferroelectric memory cells 105 may have beneficialproperties that may result in improved performance relative to othermemory architectures. For example, because ferroelectric memory cellstend to be less susceptible to degradation of stored charge, a memoryarray 100 that employs ferroelectric memory cells 105 may require feweror no refresh operations, and may thus require less power to operate.

The memory controller 140 may control the operation (e.g., read, write,re-write, refresh, etc.) of memory cells 105 through the variouscomponents, such as row decoder 120, column decoder 130, and sensecomponent 125. Memory controller 140 may generate row and column addresssignals in order to activate the desired word line 110 and digit line115. Memory controller 140 may also generate and control various voltagepotentials used during the operation of memory array 100. In general,the amplitude, shape, or duration of an applied voltage discussed hereinmay be adjusted or varied and may be different for the variousoperations for operating memory array 100. Furthermore, one, multiple,or all memory cells 105 within memory array 100 may be accessedsimultaneously; for example, multiple or all cells of memory array 100may be accessed simultaneously during a reset operation in which allmemory cells 105, or a group of memory cells 105, are set to a singlelogic state.

In some embodiments, memory controller 140 may be related to or inelectronic communication with a first plate line and a second plateline, each of which may be coupled with plates of various cells 105.Groups of cells 105 that are in electronic communication with the sameplate line may be referred to as a cell group or cell plate group. Afirst digit line may be in electronic communication with the first plateline and a first sense component (e.g., a sense amp) via a firstselection component (e.g., a transistor). A second digit line may be inelectronic communication with the second plate line and a ground orvirtual ground (e.g., Vss) via a second selection component (e.g., atransistor). Based at least in part on the electronic communication, thememory controller 140 may be operable to initiate or perform one or moreaccess operations, which may include applying a voltage to one or moreplate lines in order to increase the voltage of a cell 105 plate. Theprocess may be referred to a moving a cell plate, which may excite thecell and thus facilitate an access operation on the cell.

In some embodiments, the memory controller 140 may be operable to applya voltage or cause a voltage to be applied to a plate line of aredundant cell group in the memory array based at least in part on acorresponding normal cell group being defective in some way. In someembodiments, the memory controller 140 may be operable to isolateunselected cells, in both a normal cell group and a redundant cellgroup, from selected memory plate lines using switching components andshunt control lines.

FIG. 2 illustrates an example circuit 200 that supports a redundancyarray column decoder for ferroelectric memory in accordance with variousembodiments of the present disclosure. In the disclosure, reference ismade to ferroelectric memory for ease of comprehension and withoutlimitation. It should be appreciated that various aspects of thedisclosure may also apply to other memory technologies. Circuit 200includes a memory cell 105-a, word line 110-a, digit line 115-a, andsense component 125-a, which may be examples of a memory cell 105, wordline 110, digit line 115, and sense component 125, respectively, asdescribed with reference to FIG. 1. Memory cell 105-a may include alogic storage component, such as capacitor 205 that has a first plate,cell plate 210 and a second plate, cell bottom 215. Cell plate 210 andcell bottom 215 may be capacitively coupled through a ferroelectricmaterial positioned between them. The orientation of cell plate 210 andcell bottom 215 may be flipped without changing the operation of memorycell 105-a. Circuit 200 also includes selection component 220 andreference line 225. Cell plate 210 may be accessed via a plate line thatis electronic communication with several cells of a cell group, and cellbottom 215 may be accessed via digit line 115-a. As described above,various states may be stored by charging or discharging capacitor 205.

The stored state of capacitor 205 may be read or sensed by operatingvarious elements represented in circuit 200. Capacitor 205 may be inelectronic communication with digit line 115-a. For example, capacitor205 can be isolated from digit line 115-a when selection component 220is deactivated, and capacitor 205 can be connected to digit line 115-awhen selection component 220 is activated. Activating selectioncomponent 220 may be referred to as selecting memory cell 105-a. In somecases, selection component 220 is a transistor and its operation iscontrolled by applying a voltage to the transistor gate, where thevoltage magnitude is greater than the threshold magnitude of thetransistor. Word line 110-a may activate selection component 220; forexample, a voltage applied to word line 110-a is applied to thetransistor gate, connecting capacitor 205 with digit line 115-a.

In other examples, the positions of selection component 220 andcapacitor 205 may be switched, such that selection component 220 isconnected between plate 210 and cell plate 230 and such that capacitor205 is between digit line 115-a and the other terminal of selectioncomponent 220. In this embodiment, selection component 220 may remain inelectronic communication with digit line 115-a through capacitor 205.This configuration may be associated with alternative timing and biasingfor read and write operations.

Due to the ferroelectric material between the plates of capacitor 205,and as discussed in more detail below, capacitor 205 may not dischargeupon connection to digit line 115-a. In one scheme, to sense the logicstate stored by ferroelectric capacitor 205, word line 110-a may bebiased to select memory cell 105-a and a voltage may be applied to plate210. In some cases, digit line 115-a is virtually grounded and thenisolated from the virtual ground, which may be referred to as“floating,” prior to biasing plate 210 and word line 110-a. Biasingplate 210 may result in a voltage difference (e.g., plate 210 voltageminus digit line 115-a voltage) across capacitor 205. The voltagedifference may yield a change in the stored charge on capacitor 205,where the magnitude of the change in stored charge may depend on theinitial state of capacitor 205—e.g., whether the initial state stored alogic 1 or a logic 0. This may cause a change in the voltage of digitline 115-a based on the charge stored on capacitor 205. Operation ofmemory cell 105-a by varying the voltage to cell plate 210 may bereferred to as moving the cell plate.

The change in voltage of digit line 115-a may depend on its intrinsiccapacitance. That is, as charge flows through digit line 115-a, somefinite charge may be stored in digit line 115-a and the resultingvoltage depends on the intrinsic capacitance. The intrinsic capacitancemay depend on physical characteristics, including the dimensions, ofdigit line 115-a. Digit line 115-a may connect many memory cells 105 sodigit line 115-a may have a length that results in a non-negligiblecapacitance (e.g., on the order of picofarads (pF)). The resultingvoltage of digit line 115-a may then be compared to a reference (e.g., avoltage of reference line 225) by sense component 125-a in order todetermine the stored logic state in memory cell 105-a. Other sensingprocesses may be used in some cases.

Sense component 125-a may include various transistors or amplifiers todetect and amplify a difference in signals, which may be referred to aslatching. Sense component 125-a may include a sense amplifier thatreceives and compares the voltage of digit line 115-a and reference line225, which may be a reference voltage. The sense amplifier output may bedriven to the higher (e.g., a positive) or lower (e.g., negative orground) supply voltage based on the comparison. For instance, if digitline 115-a has a higher voltage than reference line 225, then the senseamplifier output may be driven to a positive supply voltage.

In some cases, the sense amplifier may additionally drive the digit line115-a to the supply voltage. Sense component 125-a may then latch theoutput of the sense amplifier and/or the voltage of digit line 115-a,which may be used to determine the stored state in memory cell 105-a,e.g., logic 1. Alternatively, if digit line 115-a has a lower voltagethan reference line 225, the sense amplifier output may be driven to anegative or ground voltage. Sense component 125-a may similarly latchthe sense amplifier output to determine the stored state in memory cell105-a, e.g., logic 0. The latched logic state of memory cell 105-a maythen be output, for example, through column decoder 130 as output 135with reference to FIG. 1.

To write memory cell 105-a, a voltage may be applied across capacitor205. Various methods may be used. In one example, selection component220 may be activated through word line 110-a in order to electricallyconnect capacitor 205 to digit line 115-a. A voltage may be appliedacross capacitor 205 by controlling the voltage of cell plate 230(through plate 210) and cell bottom 215 (through digit line 115-a). Towrite a logic 0, cell plate 230 may be taken high, that is, a positivevoltage may be applied to plate 210, and cell bottom 215 may be takenlow, e.g., virtually grounding or applying a negative voltage to digitline 115-a. The opposite process is performed to write a logic 1, wherecell plate 230 is taken low and cell bottom 215 is taken high.

Two or more sense components 125-a may each sense the voltage or othercharacteristics at two or more digit lines 115-a that each correspond toone or more plates 210. In some embodiments, each of these plates 210may be associated with at least one redundant cell, and the redundantcell may be accessed if its associated normal cell is determined to bedefective. In some embodiments, plate lines of adjacent cells may beisolated from one another during an access operation to prevent unwantedvoltages or currents on unselected memory cells. By using the redundancyand isolation techniques of the present disclosure and an area occupiedby the memory array may be reduced and the redundancy cell plates may beisolated.

FIG. 3 illustrates an example of non-linear electrical properties withhysteresis curves 300-a and 300-b for a ferroelectric memory cell thatis operated in accordance with various embodiments of the presentdisclosure. Hysteresis curves 300-a and 300-b illustrate an exampleferroelectric memory cell writing and reading process, respectively.Hysteresis curves 300 depict the charge, Q, stored on a ferroelectriccapacitor (e.g., capacitor 205 of FIG. 2) as a function of a voltagedifference, V.

A ferroelectric material is characterized by a spontaneous electricpolarization, i.e., it maintains a non-zero electric polarization in theabsence of an electric field. Example ferroelectric materials includebarium titanate (BaTiO3), lead titanate (PbTiO3), lead zirconiumtitanate (PZT), and strontium bismuth tantalate (SBT). The ferroelectriccapacitors described herein may include these or other ferroelectricmaterials. Electric polarization within a ferroelectric capacitorresults in a net charge at the ferroelectric material's surface andattracts opposite charge through the capacitor terminals. Thus, chargeis stored at the interface of the ferroelectric material and thecapacitor terminals. Because the electric polarization may be maintainedin the absence of an externally applied electric field for relativelylong times, even indefinitely, charge leakage may be significantlydecreased as compared with, for example, capacitors employed in DRAMarrays. This may reduce the need to perform refresh operations asdescribed above for some DRAM architectures.

Hysteresis curves 300 may be understood from the perspective of a singleterminal of a capacitor. By way of example, if the ferroelectricmaterial has a negative polarization, positive charge accumulates at theterminal. Likewise, if the ferroelectric material has a positivepolarization, negative charge accumulates at the terminal. Additionally,it should be understood that the voltages in hysteresis curves 300represent a voltage difference across the capacitor and are directional.For example, a positive voltage may be realized by applying a positivevoltage to the terminal in question (e.g., a cell plate 230) andmaintaining the second terminal (e.g., a cell bottom 215) at ground (orapproximately zero volts (0V)). A negative voltage may be applied bymaintaining the terminal in question at ground and applying a positivevoltage to the second terminal—i.e., positive voltages may be applied tonegatively polarize the terminal in question. Similarly, two positivevoltages, two negative voltages, or any combination of positive andnegative voltages may be applied to the appropriate capacitor terminalsto generate the voltage difference shown in hysteresis curves 300.

As depicted in hysteresis curve 300-a, the ferroelectric material maymaintain a positive or negative polarization with a zero voltagedifference, resulting in two possible charged states: charge state 305and charge state 310. In some examples, charge state 305 represents alogic 0 and charge state 310 represents a logic 1. In some examples, thelogic values of the respective charge states may be reversed toaccommodate other schemes for operating a memory cell.

A logic 0 or 1 may be written to the memory cell by controlling theelectric polarization of the ferroelectric material, and thus the chargeon the capacitor terminals, by applying voltage. For example, applying anet positive voltage 315 across the capacitor results in chargeaccumulation until charge state 305-a is reached. Upon removing voltage315, charge state 305-a follows path 320 until it reaches charge state305 at zero voltage potential. Similarly, charge state 310 is written byapplying a net negative voltage 325, which results in charge state310-a. After removing negative voltage 325, charge state 310-a followspath 330 until it reaches charge state 310 at zero voltage. Chargestates 305-a and 310-a may also be referred to as the remnantpolarization (Pr) values, i.e., the polarization (or charge) thatremains upon removing the external bias (e.g., voltage). The coercivevoltage is the voltage at which the charge (or polarization) is zero.

To read, or sense, the stored state of the ferroelectric capacitor, avoltage may be applied across the capacitor. In response, the storedcharge, Q, changes, and the degree of the change depends on the initialcharge state—i.e., the final stored charge (Q) depends on whether chargestate 305-b or 310-b was initially stored. For example, hysteresis curve300-b illustrates two possible stored charge states 305-b and 310-b.Voltage 335 may be applied across the capacitor as discussed withreference to FIG. 2. In other cases, a fixed voltage may be applied tothe cell plate and, although depicted as a positive voltage, voltage 335may be negative. In response to voltage 335, charge state 305-b mayfollow path 340. Likewise, if charge state 310-b was initially stored,then it follows path 345. The final position of charge state 305-c andcharge state 310-c depend on a number of factors, including the specificsensing scheme and circuitry.

In some cases, the final charge may depend on the intrinsic capacitanceof the digit line connected to the memory cell. For example, if thecapacitor is electrically connected to the digit line and voltage 335 isapplied, the voltage of the digit line may rise due to its intrinsiccapacitance. So a voltage measured at a sense component may not equalvoltage 335 and instead may depend on the voltage of the digit line. Theposition of final charge states 305-c and 310-c on hysteresis curve300-b may thus depend on the capacitance of the digit line and may bedetermined through a load-line analysis—i.e., charge states 305-c and310-c may be defined with respect to the digit line capacitance. As aresult, the voltage of the capacitor, voltage 350 or voltage 355, may bedifferent and may depend on the initial state of the capacitor.

By comparing the digit line voltage to a reference voltage, the initialstate of the capacitor may be determined. The digit line voltage may bethe difference between voltage 335 and the final voltage across thecapacitor, voltage 350 or voltage 355—i.e., (voltage 335-voltage 350) or(voltage 335-voltage 355). A reference voltage may be generated suchthat its magnitude is between the two possible voltages of the twopossible digit line voltages in order to determine the stored logicstate—i.e., if the digit line voltage is higher or lower than thereference voltage. For example, the reference voltage may be an averageof the two quantities, (voltage 335-voltage 350) and (voltage335-voltage 355). Upon comparison by the sense component, the senseddigit line voltage may be determined to be higher or lower than thereference voltage, and the stored logic value of the ferroelectricmemory cell (i.e., a logic 0 or 1) may be determined.

As discussed above, reading a memory cell that does not use aferroelectric capacitor may degrade or destroy the stored logic state. Aferroelectric memory cell, however, may maintain the initial logic stateafter a read operation. For example, if charge state 305-b is stored,the charge state may follow path 340 to charge state 305-c during a readoperation and, after removing voltage 335, the charge state may returnto initial charge state 305-b by following path 340 in the oppositedirection. In some embodiments, redundant memory cells may be includedin a memory array. The redundant cells may be constructed of the samematerial, and may thus have the same ferroelectric properties, as othercells of the array. In some embodiments, to further protect stored logicon a ferroelectric memory cells, unselected memory cells may be isolatedfrom selected memory cells during an access operation.

FIG. 4 illustrates an example array 400 that supports a redundancy arraycolumn decoder for ferroelectric memory in accordance with variousembodiments of the present disclosure. In the disclosure, reference ismade to ferroelectric memory for ease of comprehension and withoutlimitation. It should be appreciated that various aspects of thedisclosure may also apply to other memory technologies. Array 400 mayinclude a ferroelectric memory cells, including plates (e.g., 210-a to210-t), and, one or more word lines (e.g., 110-a to 110-h), digit lines(e.g., 115-a to 115-h, 115-i to 115-l, 115-m to 115-t, etc.), sensecomponents (e.g., 125-a to 125-d, 125-h to 125-l, etc.) and shuntcontrol lines (e.g., 405-a to 405-d), which may be examples of a memorycell 105 (and plates 210), word line 110, digit line 115, sensecomponent 125, and selection component 220, respectively, as describedwith reference to FIG. 1, 2, or others. These terminals may be separatedby an insulating ferroelectric material. As described above, variousstates may be stored by charging or discharging capacitor 205.

The cell plates 210 of the array 400 may be grouped so that plates 210of various memory cells are operated concurrently or during a commonaccess operation. Array 400 may include cell plate groups 410-a, 410-b,and 410-c. Each of the plate groups 410 may include one or more cellplates 210 or plate lines in electronic communication with cell plates210. For example, plate group 410-a may include cell plates 210-a to210-h, plate group 410-b may include cell plates 210-i to 210-l, andplate group 410-c may include cell plates 210-m to 210-t. In someexamples, different plate groups 410 may perform different functions inthe array 400. For example, plate groups 410-a and 410-c may includenormal cell plates 210 designed to be used during the normal operationof the array 400. As such, plate groups 410-a and 410-c may be referredto as normal cell plate groups. A first set of switching components maybe associated with each cell plate group 410-a and 410-c. In someexamples, the first set of switching components may include a firstsubset of switching components that provide a first functionality and asecond subset of switching components that provide a secondfunctionality. The switching components are discussed in greater detailbelow.

Plate group 410-b may include redundant cell plates 210 designed to beused only when a normal cell plate is defective. As such, plate group410-b may be referred to as a redundant plate group because the cellplates in plate group 410-b are redundant to the certain cell plates inplate groups 410-a and 410-c. A second set of switching components maybe associated with plate group 410-b. In some examples, the second setof switching components may include a first subset of switchingcomponents that provide a first functionality and a second subset ofswitching components that provide a second functionality. The switchingcomponents are discussed in greater detail below.

In some examples, the redundant cell plate group 410-b may be associatedwith multiple normal cell plate groups (e.g., plate groups 410-a,410-c). In some examples, the redundant cell plate group 410-b may beassociated with a single normal plate group 410. A cell plate group 410may include any number of cell plates. In the illustrative example ofFIG. 4, the normal cell plate groups 410-a, 410-c include eight cellplates 210 and the redundant cell plate group 410-b includes four cellplates 210. However, in other examples, each of these plate groups 410may include more or less cell plates 210. For example, in theillustrative example of FIG. 7, a normal cell plate group 710 includessixteen cell plates 210 and a redundant cell plate group 720 includesfour cell plates 210. In some examples, a number of cell plates 210 in aredundant cell plate group may be an integer multiple of a number ofcell plates 210 in an associated normal cell plate group. In someexamples, the number of cell plates 210 in a redundant plate groupcorresponds to a number of shunt control lines 405 in the array 400. Forexample, in the illustrative example, there are four shunt control linesand four redundant cell plates (e.g., 210-i to 210-l). In otherexamples, however, the number of shunt control lines and redundant cellplates in a redundant plate group are not always equal.

The array 400 may also include selection switching components 415 (e.g.,415-a to 415-h, 415-i to 415-l, and 415-m to 415-t, etc.). In someexamples, the selection switching components 415 may be positioned atintersections of word lines 110 and digit lines 115 and may be connectedto a digit line 115 and a word line 110. In some examples, the selectionswitching components 415 may be positioned at intersections of shuntcontrol lines 405 and digit lines (e.g., 415-k to 415-n). The selectionswitching components 415 may be configured to electronically couple acell plate 210 to a sense component 125 based at least in part on aselect line being selected (e.g., word line 110 or shunt control line405). For example, selection switching component 415-a may be configuredto connect cell plate 210-a to sense component 125-a based at least inpart on word line 110-a being selected. The selection switchingcomponents 415 may be similarly embodied as the selection component 220discussed above. In some embodiments, the selection switching components415 may be or include a transistor and its operation may be controlledby applying a voltage to a transistor gate, where the voltage has amagnitude greater than the threshold magnitude of the transistor.

The array 400 may also include shunt switching components 420 (e.g.,420-a to 420-h, 420-i to 420-l, and 420-m to 420-t, etc.). The shuntswitching components 420 may be positioned at intersections of shuntcontrol lines 405 and digit lines 115. The shunt switching components420 may be configured to electronically couple a cell plate 210 to aground, virtually ground, or a voltage source (e.g., Vss). As shown inmore detail in FIG. 5, the shunt switching components 420 are connectedin parallel with the selection switching components 415. The shuntswitching components 420 are depicted in FIGS. 4, 6, and 7 to showpositions of the shunt switching components 420 relative to the othercomponents of the arrays 400, 600, and 700. The shunt switchingcomponents 420 are designed to isolate unselected memory cells orunselected cell plates from selected memory cells or selected cellplates during an access operation. During an access operation, voltagesand/or currents may be induced on unselected memory cells, which mayalter or affect the logic state stored on the unselected memory cells.By connecting a digit line 115 of an unselected memory cell orunselected cell plate 210 to ground or a virtual ground, a voltagecannot be induced on the digit line 115 and the logic state of thememory cell may remain undisturbed. The shunt switching components 420may be similarly embodied as the selection component 220 or theselection switching component 415 discussed above. In some embodiments,the shunt switching components 420 may be or include a transistor andits operation may be controlled by applying a voltage to a transistorgate, where the voltage has a magnitude greater than the thresholdmagnitude of the transistor. In the figures, the shunt switchingcomponent 420 are denoted by symbols of transistors surrounded by acircle.

During an access operation, a memory controller (e.g., memory controller140) of the array 400 may determine a selected memory cell on which toperform an access operation. As part of the access operation, the memorycontroller may select the cell plate to bias the ferroelectric memorycell, may select the associated word line 110 to connect the cell plateto sense component, and may select the associated digit line 115 of thearray 400. When selecting these different lines, one or more unselectedmemory cells may be disturbed. For example, more than one memory cell orcell plate 210 may be accessed via a single plate 210. When the plate210 is accessed, the unselected memory cells associated with the plate210 may be disturbed. A memory controller may attempt to mitigatedisturbances to unselected memory cells by isolating those memory cellsfrom the selected memory cell. For example, the memory controller mayelectronically couple one or more unselected memory cells or unselectedcell plates to a ground or virtual ground. To couple to a ground avirtual ground, the controller may select one or more shunt controllines 405 based at least in part on which unselected memory cells are tobe isolated. Once selected, the shunt switching components 420 coupledto the selected shunt control lines 405 may be activated and therespective digit lines 115 connected to a ground or a virtual ground.

As shown in FIG. 4, the cell plate group 410-b may be isolated from theword lines 110 (e.g., 110-a to 110-h) such that the access lines are notin electronic communication with the cell plate group 410-b. Switchingcomponents of any type (e.g., selection switching components 415 andshunt switching components 420) are not positioned at the intersectionsof the word lines 110 and the digit lines 115-i to 115-l. Instead,selection switching components 415-i to 415-l are positioned at theintersections of shunt control lines 405 and digit lines 115-i to 115-l.In this way, the structure of the redundant portion of the array 400 maybe designed to occupy less space of the array 400.

FIG. 5 illustrates an example of access circuitry 500 of a redundantcell plate 210 in accordance with various embodiments of the presentdisclosure. For example, FIG. 5 may illustrate an example of accesscircuitry to cell plate 210-i. However, the access circuitry 500 mayalso be used to describe the access circuitry to other cell plates 210.

The cell plate 210-i may be coupled to either a sense component 125-e or125-f or to virtual ground 505 (e.g., Vss). For example, if shuntcontrol line 405-b is selected, the shunt switching component 420-i maybe closed and node 510 on digit line 115-i may be coupled to virtualground. If shunt control line 405-d is selected, the selection switchingcomponent 415-i may be closed and the node 510 on the digit line 115-imay be coupled to a sense component 125-e or 125-f. As is discussedherein, the configurations of the shunt control lines 405 and theswitching components 415, 420 may be selected based on a number ofrelationships between the cell plate groups 410-a, 410-b, 410-c suchthat any given digit line 115 may not be connect to both a virtualground 505 and a sense component 125 at the same time.

In some examples, the relative locations of the selection switchingcomponent 415 and the shunt switching component 420 may be switched suchthat the selection switching component 415 may be positioned closer tothe cell plate 210. For example, see the access circuitry associatedwith cell plates 210-k, 210-l. In some examples, the selection switchingcomponent 415 may be electronically coupled to a word line 110. Forexample, see the access circuitry associated with cell plates 210-a to210-h and 210-m to 210-t.

Each redundant cell plate 210-i, 210-j, 210-k, 210-l may be associatedwith one or more normal cell plates 210-a to 210-h, 210-m to 210-t. Forexample, in the illustrative example of FIG. 4, redundant cell plate210-j may be associated with normal cell plate 210-a and normal cellplate 210-e. These associations between redundant cell plates and normalcell plates may be based at least in part on one or more relationshipsbetween the normal cell plate groups 410-a, 410-c and the shunt controllines 405. The association of a redundant cell plate 210 and a normalcell plate 210 may be based at least in part on a subset of cell plates210 of a normal plate group (e.g., 410-a) electronically coupled to asingle shunt control line 405

FIG. 6 illustrates an example of a portion 600 of the array 400 inaccordance with various embodiments of the present disclosure. Theportion 600 has been selected to illustrate one or more relationshipsbetween normal cell plates and redundant cell plates. A configuration ofshunt switching components 420 associated with cell plate group 410-bmay be based at least in part on a subset 605 of memory cells of thecell plate group 410-a. A configuration of selection switchingcomponents 415 associated with cell plate group 410-b may be based atleast in part on a subset 610 of memory cells of the cell plate group410-a. For illustrative purposes, FIG. 6 shows only the configurationsrelative to a single shunt control line 405-a. However, it should beappreciated that the principles disclosed below may be adapted andapplied to other shunt control lines as well (e.g., shunt control lines405-b, 405-c, 405-d, etc.).

The subset 605 includes cell plate 210-a and cell plate 210-e. The cellplate 210-j may relate to cell plates of subset 605 based at least inpart on the positions of shunt switching components 420-a, 420-e on theshunt control line 405-a. Subset 605 may be determined based on whichcell plates 210 of the cell plate group 410-a are electronically coupledto the shunt control line 405-a via shunt switching components 420. Theshunt switching component 420-j is positioned on the shunt control line405-a and is configured to connect cell plate 210-j to a virtual groundwhen shunt control line 405-a is selected.

The subset 610 includes cell plate 210-c and cell plate 210-g. The cellplate 210-l may relate to cell plates of subset 610 based at least inpart on the positions of cell plates of subset 610 relative to subset605. In the illustrative embodiment, at least one cell plate is betweena cell plate of subset 605 and a cell plate of subset 610. In someexamples, cell plates of subset 610 may be determined based on thedistance of those cell plates from the cell plates of subset 605 (whichrelates to the positions of shunt switching components on a single shuntcontrol line). In this manner, the coupling between activated cellplates and shunted cell plates may be further reduced. The selectionswitching component 415-l is positioned on the shunt control line 405-aand is configured to connect the cell plate 210-l to a sense component125-g or sense component 125-h when the shunt control line 405-a isselected. In some examples, the subset 610 may be determined based onwhich cell plates 210 of the cell plate group 410-a are electronicallycoupled to a different shunt control line 405 (e.g., shunt control lines405-b, 405-c, 405-d) via shunt switching components 420.

Returning to FIG. 4, the sense components 125 may be positioned toelectronically couple to different digit lines 115 of their respectivecell plate groups 410. In some examples, the number of sense components125 coupled to the cell plate group 410-a is equal to the number ofsense components 125 coupled to the cell plate group 410-b.

In accordance with various embodiments of the present disclosure,additional elements are contemplated, although each may not beexplicitly labeled or shown. For example, in addition to digit lines115-a (relating to cell plate 210-a) array 400 may include additionaldigit lines 115 relating to other cell plates 210. In some examples,multiple digit lines 115-a extend from the cell plate 210-a. Forexample, in addition to selection switching component 415-a (relating tocell plate 210-a), array 400 may include additional selection switchingcomponents 415 relating to other cell plates 210. For example, inaddition to shunt switching component 420-a (relating to cell plate210-a), array 400 may include additional selection switching components415 relating to other cell plates 210.

FIG. 7 illustrates an example of a memory array 700 and other componentsthat support a redundancy array column decoder for ferroelectric memoryin accordance with various embodiments of the present disclosure. Memoryarray 700 may be similarly embodied as memory array 400 described above.Array 700 illustrates how normal cell plates 705 in a normal cell plategroup 710 may relate to redundant cell plates 715 in a redundant cellplate group 720 when there are sixteen normal cell plates 705 and fourredundant cell plates 715. In the illustrative example, each redundantcell plate 715 may be associated with four normal cell plates 705. Therelationships defining the configurations of switching components may bethe same relationships as those described above with regard to array400. In some examples, the number of redundant cell plates 715 may be aninteger multiple of the number of normal cell plates 705.

FIG. 8 shows a block diagram 800 of a memory array 805 that thatsupports a redundancy array column decoder for memory in accordance withvarious embodiments of the present disclosure. Memory array 805 may bereferred to as an electronic memory apparatus, and may be an example ofa component of a memory array 100 as described with reference to FIG. 1.In some examples, array 805 may be an example of a component of array400 as described with reference to FIG. 4.

Memory array 805 may include one or more memory cells 810, a memorycontroller 815, a word line 820, a plate line 825, a reference component830, a sense component 835, a digit line 840, and a latch 845. Thesecomponents may be in electronic communication with each other and mayperform one or more of the functions described herein. In some cases,memory controller 815 may include biasing component 850, timingcomponent 855, and isolation component 870.

Memory controller 815 may be in electronic communication with word line820, digit line 840, sense component 835, and plate line 825, which maybe examples of word line 110, digit line 115, sense component 125, andplate line 210 described with reference to FIGS. 1, and 2. Memory array805 may also include reference component 830 and latch 845. Thecomponents of memory array 805 may be in electronic communication witheach other and may perform embodiments of the functions described withreference to FIGS. 1 through 7. In some cases, reference component 830,sense component 835, and latch 845 may be components of memorycontroller 815.

In some examples, digit line 840 is in electronic communication withsense component 835 and a ferroelectric capacitor of ferroelectricmemory cells 810. A ferroelectric memory cell 810 may be writable with alogic state (e.g., a first or second logic state). Word line 820 may bein electronic communication with memory controller 815 and a selectioncomponent of ferroelectric memory cell 810. Plate line 825 may be inelectronic communication with memory controller 815 and a plate of theferroelectric capacitor of ferroelectric memory cell 810. Sensecomponent 835 may be in electronic communication with memory controller815, digit line 840, latch 845, and reference line 860. Referencecomponent 830 may be in electronic communication with memory controller815 via reference line 860. Sense control line 865 may be in electroniccommunication with sense component 835 and memory controller 815. Thesecomponents may also be in electronic communication with othercomponents, both inside and outside of memory array 805, in addition tocomponents not listed above, via other components, connections, orbusses.

Memory controller 815 may be configured to activate the word line 820,plate line 825, or digit line 840 by applying voltages to those variousnodes. For example, biasing component 850 may be configured to apply avoltage to operate memory cell 810 to read or write memory cell 810 asdescribed above. In some cases, memory controller 815 may include a rowdecoder, column decoder, or both, as described with reference to FIG. 1.This may enable the memory controller 815 to access one or more memorycells 105. Biasing component 850 may also provide voltage potentials toreference component 830 in order to generate a reference signal forsense component 835. Additionally, biasing component 850 may providevoltage potentials for the operation of sense component 835.

In some cases, memory controller 815 may perform its operations usingtiming component 855. For example, timing component 855 may control thetiming of the various word line selections or plate biasing, includingtiming for switching and voltage application to perform the memoryfunctions, such as reading and writing, discussed herein. In some cases,timing component 855 may control the operations of biasing component850.

In some cases, memory controller 815 may perform its operations usingisolation component 870. For example, isolation component 870 maycontrol which memory cells or cell plates are electronically coupled toa ground or a virtual ground during an access operation.

Reference component 830 may include various components to generate areference signal for sense component 835. Reference component 830 mayinclude circuitry configured to produce a reference signal. In somecases, reference component 830 may be implemented using otherferroelectric memory cells 105. Sense component 835 may compare a signalfrom memory cell 810 (through digit line 840) with a reference signalfrom reference component 830. Upon determining the logic state, thesense component may then store the output in latch 845, where it may beused in accordance with the operations of an electronic device thatmemory array 805 is a part. Sense component 835 may include a senseamplifier in electronic communication with the latch and theferroelectric memory cell.

Memory controller 815 may be an example of the memory controller 915, orelements of the memory controller 915, described with reference to FIG.9.

In some examples, the memory array 805 may include a first portion of amemory array that includes a first number of memory cells, a secondportion of the memory array that includes a second number of memorycells, wherein the first number is an even integer multiple of thesecond number, a set of shunt control lines in electronic communicationwith the memory cells of the first portion of the memory array and atleast one memory cell of the second portion of the memory array, a firstset of switching components coupled with the shunt control lines andassociated with the first portion of the memory array, and a second setof switching components coupled with the shunt control lines andassociated with the second portion of the memory array, wherein aconfiguration of the second set of switching components with respect tothe memory cells of the second portion of the memory array is based atleast in part on a configuration of the first set of switchingcomponents with respect to the memory cells of the first portion of thememory array.

In some examples, the configuration of the first set of set of switchingcomponents with respect to the memory cells of the first portion of thememory array may be based at least in part on a cyclic shift of thememory cells of the first portion of the memory array. In some examples,the second set of switching components may include a first subset ofswitching components, and a second subset of switching components. Insome examples, the first subset of switching components may couple thememory cells of the second portion of the memory array to ground orvirtual ground. In some examples, the second subset of switchingcomponents may couple each memory cell of the second portion of thememory array to a sense amplifier.

In some examples, a configuration of the first subset of switchingcomponents with respect to the memory cells of the second portion of thememory array may be based at least in part on the configuration of thefirst set of switching components with respect to the memory cells ofthe first portion of the memory array, a configuration of the secondsubset of switching components with respect to the memory cells of thesecond portion of the memory array may be based at least in part on theconfiguration of the first set of switching components with respect tothe memory cells of the first portion of the memory array, and theconfiguration of the first subset of switching components may bedifferent from the configuration of the second subset of switchingcomponents.

In some examples, the configuration of the first subset of switchingcomponents and the configuration of the second subset of switchingcomponents may be based at least in part on a subset of memory cells ofthe first portion of the memory array coupled to a single shunt controlline. In some examples, a first memory cell of the second portion of thememory array may be associated with the subset of memory cells of thefirst portion of the memory array, and at least one switching componentof the first subset of switching components may be positioned on thesingle shunt control line and is in electronic communication with thefirst memory cell of the second portion of the memory array. In someexamples, a second memory cell of the second portion of the memory arraymay be unassociated with any memory cell in the subset of memory cellsof the first portion of the memory array, and at least one switchingcomponent of the second subset of switching components may be positionedon the single shunt control line and is in electronic communication withthe second memory cell of the second portion of the memory array.

In some examples, the memory array 805 may include a set of access linesin electronic communication with the first portion of the memory arrayand isolated from the second portion of the memory array. In someexamples, the memory array 805 may include a third portion of the memoryarray that may include the first number of memory cells, and a third setof switching components may be coupled with the shunt control lines andassociated with the third portion of the memory array, a configurationof the third set of switching components with respect to the memorycells of the third portion of the memory array may be based at least inpart on the configuration of the first set of switching components withrespect to the memory cells of the first portion of the memory array.

In some examples, the at least one memory cell of the second portion ofthe memory array may be redundant to at least one memory cell of thefirst portion of the memory array. In some examples, the at least onememory cell of the second portion of the memory array may be redundantto at least one memory cell of the first portion of the memory array. Insome examples, a number of switching components of the second set may bean integer multiple of the second number of memory cells. In someexamples, the array 805 may include a first set of sense amplifierscoupled to the memory cells of the first portion of the memory array,and a second set of sense amplifiers coupled to the memory cells of thesecond portion of the memory array.

In other examples, the memory array 805 may include a first portion of amemory array that includes a first number of memory cells, a secondportion of the memory array that includes a second number of memorycells, wherein the first number is an integer multiple of the secondnumber, and a number of shunt control lines in electronic communicationwith the memory cells of the first portion of the memory array and thememory cells of the second portion of the memory array, wherein thesecond number of memory cells in the second portion of the memory arrayis equal to the number of shunt control lines.

In some examples, a subset of memory cells from the first portion of thememory array may be coupled to a single shunt control line, and a singlememory cell of the second portion of the memory array corresponds to thesubset of memory cells and may be coupled to the single shunt controlline.

In some examples, the memory array 805 may include a set of firstswitching components in electronic communication with the number ofshunt control lines, wherein the first set of switching components maycouple the memory cells of the first portion of the memory array and thememory cells of the second portion of the memory array to ground orvirtual ground. In some examples, the memory array 805 may include asecond set of switching components in electronic communication with thenumber of shunt control lines, wherein the second set of switchingcomponents may couple the memory cells of the second portion of thememory array to sense amplifiers.

In other examples, the memory array 805 may include a memory array thatmay include a first portion and a second portion with at least one cellredundant to a cell of the first portion, wherein a first number ofmemory cells of the first portion may be an integer multiple of a secondnumber of memory cells of the second portion, at least one shunt controlline, and a controller in electronic communication with the memory arrayand the at least one shunt control line, wherein the controller may beoperable to: access a memory cell of the first portion of the memoryarray during an access operation, and isolate a memory cell of thesecond portion of the memory array during the access operation using theat least one shunt control line and based at least in part on accessingthe memory cell of the first portion of the memory array.

FIG. 9 shows a diagram of a system 900 including a device 905 thatsupports a redundancy array column decoder for memory in accordance withvarious embodiments of the present disclosure. Device 905 may be anexample of or include the components of a memory array 100 as describedabove, e.g., with reference to FIG. 1.

Device 905 may include components for bi-directional voice and datacommunications including components for transmitting and receivingcommunications, including memory controller 915, memory cells 920, BIOScomponent 925, processor 930, I/O control component 935, and peripheralcomponents 940.

Memory controller 915 may operate one or more memory cells as describedherein. Specifically, memory controller 915 may be configured to supportfull bias sensing in a three-dimensional memory array. In some cases,memory controller 915 may include a row decoder, column decoder, orboth, as described with reference to FIG. 1.

Memory cells 920 may store information (i.e., in the form of a logicalstate) as described herein.

BIOS component 925 be a software component that includes a basicinput/output system (BIOS) operated as firmware, which may initializeand run various hardware components. BIOS component 925 may also managedata flow between a processor and various other components, e.g.,peripheral components, input/output control component, etc. BIOScomponent 925 may include a program or software stored in read-onlymemory (ROM), flash memory, or any other non-volatile memory.

Processor 930 may include an intelligent hardware device, (e.g., ageneral-purpose processor, a digital signal processor (DSP), a centralprocessing unit (CPU), a microcontroller, an application specificintegrated circuit (ASIC), a field-programmable gate array (FPGA), aprogrammable logic device, a discrete gate or transistor logiccomponent, a discrete hardware component, or any combination thereof).In some cases, processor 930 may be configured to operate a memory arrayusing a memory controller. In other cases, a memory controller may beintegrated into processor 930. Processor 930 may be configured toexecute computer-readable instructions stored in a memory to performvarious functions (e.g., function or tasks supporting full bias sensingin a three-dimensional memory array).

Input/output (I/O) control component 935 may manage input and outputsignals for device 905. Input/output control component 935 may alsomanage peripherals not integrated into device 905. In some cases,input/output control component 935 may represent a physical connectionor port to an external peripheral. In some cases, I/O control component935 may utilize an operating system such as iOS®, ANDROID®, MS-DOS®,MS-WINDOWS®, OS/2®, UNIX®, LINUX®, or another known operating system.

Peripheral components 940 may include any input or output device, or aninterface for such devices. Examples may include disk controllers, soundcontroller, graphics controller, Ethernet controller, modem, universalserial bus (USB) controller, a serial or parallel port, or peripheralcard slots, such as peripheral component interconnect (PCI) oraccelerated graphics port (AGP) slots.

Input 945 may represent a device or signal external to device 905 thatprovides input to device 905 or its components. This may include a userinterface or an interface with or between other devices. In some cases,input 945 may be managed by I/O control component 935, and may interactwith device 905 via a peripheral component 940.

Output 950 may also represent a device or signal external to device 905configured to receive output from device 905 or any of its components.Examples of output 950 may include a display, audio speakers, a printingdevice, another processor or printed circuit board, etc. In some cases,output 950 may be a peripheral element that interfaces with device 905via peripheral component(s) 940. In some cases, output 950 may bemanaged by I/O control component 935.

The components of device 905 may include circuitry designed to carry outtheir functions. This may include various circuit elements, for example,conductive lines, transistors, capacitors, inductors, resistors,amplifiers, or other active or inactive elements, configured to carryout the functions described herein.

FIG. 10 shows a flowchart illustrating a method 1000 for a redundancyarray column decoder for memory in accordance with various embodimentsof the present disclosure. The operations of method 1000 may beimplemented by a memory controller 140 or its components as describedherein. For example, the operations of method 1000 may be performed by amemory controller as described with reference to FIGS. 1, 8, and 9. Insome examples, a memory controller 140 may execute a set of codes tocontrol the functional elements of the device to perform the functionsdescribed below. Additionally or alternatively, the memory controller140 may perform some or all of the functions described below usingspecial-purpose hardware.

At block 1005 the memory controller 140 may access a memory cell of afirst portion of a memory array during an access operation, wherein afirst number of memory cells in the first portion of the memory arraycomprises an integer multiple of a second number of memory cells in asecond portion of the memory array that includes at least one cellredundant to a cell of the first portion of the memory array. Theoperations of block 1005 may be performed according to the methodsdescribed with reference to FIGS. 1 through 7. In certain examples,operations of block 1005 may be performed by the isolation component 870as described with reference to FIG. 8.

In some cases, the method may also include selecting a shunt controlline during the access operation based at least in part on the memorycell of the first portion of the memory array that is accessed.

At block 1010 the memory controller 140 may isolate a memory cell of asecond portion of the memory array during the access operation, whereinthe memory cell of the second portion of the memory array is isolatedbased at least in part on accessing the memory cell of the first portionof the memory array. The operations of block 1010 may be performedaccording to the methods described with reference to FIGS. 1 through 7.In certain examples, operations of block 1010 may be performed by theisolation component 870 as described with reference to FIG. 8.

In some cases, the method may also include isolating a set of memorycells of the first portion of the memory array during the accessoperation, wherein the set of memory cells is isolated based at least inpart on the shunt control line selected. In some cases, the method mayalso include comparing an identifier of the memory cell of the firstportion of the memory array to an array mapping index that associateseach memory cell of the first portion of the memory array with a memorycell of the second portion of the memory array. In some cases, themethod may also include determining the shunt control line to selectedbased at least in part on the comparison. In some cases, the method mayalso include accessing a second memory cell of the second portion of thememory array based at least in part on the shunt control line selected.

FIG. 11 shows a flowchart illustrating a method 1100 for a redundancyarray column decoder for memory in accordance with various embodimentsof the present disclosure. The operations of method 1100 may beimplemented by a memory controller 140 or its components as describedherein. For example, the operations of method 1100 may be performed bythe isolation component 870 as described with reference to FIG. 8. Insome examples, a memory controller 140 may execute a set of codes tocontrol the functional elements of the device to perform the functionsdescribed below. Additionally or alternatively, the memory controller140 may perform functions described below using special-purposehardware.

At block 1105 the memory controller 140 may access a memory cell of afirst portion of a memory array during an access operation, wherein afirst number of memory cells in the first portion of the memory arraycomprises an integer multiple of a second number of memory cells in asecond portion of the memory array that includes at least one cellredundant to a cell of the first portion of the memory array. Theoperations of block 1105 may be performed according to the methodsdescribed with reference to FIGS. 1 through 7. In certain examples,operations of block 1105 may be performed by the isolation component 870as described with reference to FIG. 8.

At block 1110 the memory controller 140 may select a shunt control lineduring the access operation based at least in part on the memory cell ofthe first portion of the memory array that is accessed. The operationsof block 1110 may be performed according to the methods described withreference to FIGS. 1 through 7. In certain examples, operations of block1110 may be performed by the isolation component 870 as described withreference to FIG. 8.

At block 1115 the memory controller 140 may isolate a memory cell of asecond portion of the memory array during the access operation, whereinthe memory cell of the second portion of the memory array is isolatedbased at least in part on accessing the memory cell of the first portionof the memory array. The operations of block 1115 may be performedaccording to the methods described with reference to FIGS. 1 through 7.In certain examples, operations of block 1115 may be performed by theisolation component 870 as described with reference to FIG. 8.

In some cases, the method 1100 may isolate a set of memory cells of thefirst portion of the memory array during the access operation, whereinthe set of memory cells is isolated based at least in part on the shuntcontrol line selected. In some cases, the method 1100 may compare anidentifier of the memory cell of the first portion of the memory arrayto an array mapping index that associates each memory cell of the firstportion of the memory array with a memory cell of the second portion ofthe memory array, and determine the shunt control line to selected basedat least in part on the comparison. In some cases, the method 1100 mayaccess a second memory cell of the second portion of the memory arraybased at least in part on the shunt control line selected.

It should be noted that the methods described above describe possibleimplementations, and that the operations and the steps may be rearrangedor otherwise modified and that other implementations are possible.Furthermore, elements or features from two or more of the methods may becombined.

The term ‘access line’ may be used interchangeable with the term ‘commonconductive line,’ ‘word line,’ ‘digit line,’ ‘bit line,’ or othersimilar nomenclature. The term ‘word line’ may be used interchangeablywith the term ‘digit select line.’ The term ‘shunt control line’ may beused interchangeable with the term ‘digit line shunt line.’

Information and signals described herein may be represented using any ofa variety of different technologies and techniques. For example, data,instructions, commands, information, signals, bits, symbols, and chipsthat may be referenced throughout the above description may berepresented by voltages, currents, electromagnetic waves, magneticfields or particles, optical fields or particles, or any combinationthereof. Some drawings may illustrate signals as a single signal;however, it will be understood by a person of ordinary skill in the artthat the signal may represent a bus of signals, where the bus may have avariety of bit widths.

As used herein, the term “virtual ground” refers to a node of anelectrical circuit that is held at a voltage of approximately zero volts(0V) but that is not directly connected with ground. Accordingly, thevoltage of a virtual ground may temporarily fluctuate and return toapproximately 0V at steady state. A virtual ground may be implementedusing various electronic circuit elements, such as a voltage dividerconsisting of operational amplifiers and resistors. Otherimplementations are also possible. “Virtual grounding” or “virtuallygrounded” means connected to approximately 0V.

The term “electronic communication” refers to a relationship betweencomponents that supports electron flow between the components. This mayinclude a direct connection between components or may includeintermediate components. Components in electronic communication may beactively exchanging electrons or signals (e.g., in an energized circuit)or may not be actively exchanging electrons or signals (e.g., in ade-energized circuit) but may be configured and operable to exchangeelectrons or signals upon a circuit being energized. By way of example,two components physically connected via a switch (e.g., a transistor)are in electronic communication regardless of the state of the switch(i.e., open or closed).

The term “isolated” refers to a relationship between components in whichelectrons are not presently capable of flowing between them; componentsare isolated from each other if there is an open circuit between them.For example, two components physically connected by a switch may beisolated from each other when the switch is open.

As used herein, the term “shorting” refers to a relationship betweencomponents in which a conductive path is established between thecomponents via the activation of a single intermediary component betweenthe two components in question. For example, a first component shortedto a second component may exchange electrons with the second componentwhen a switch between the two components is closed. Thus, shorting maybe a dynamic operation that enables the flow of charge betweencomponents (or lines) that are in electronic communication.

The devices discussed herein, including memory array 100, may be formedon a semiconductor substrate, such as silicon, germanium,silicon-germanium alloy, gallium arsenide, gallium nitride, etc. In somecases, the substrate is a semiconductor wafer. In other cases, thesubstrate may be a silicon-on-insulator (SOI) substrate, such assilicon-on-glass (SOG) or silicon-on-sapphire (SOP), or epitaxial layersof semiconductor materials on another substrate. The conductivity of thesubstrate, or sub-regions of the substrate, may be controlled throughdoping using various chemical species including, but not limited to,phosphorous, boron, or arsenic. Doping may be performed during theinitial formation or growth of the substrate, by ion-implantation, or byany other doping means.

A transistor or transistors discussed herein may represent afield-effect transistor (FET) and comprise a three terminal deviceincluding a source, drain, and gate. The terminals may be connected toother electronic elements through conductive materials, e.g., metals.The source and drain may be conductive and may comprise a heavily-doped,e.g., degenerate, semiconductor region. The source and drain may beseparated by a lightly-doped semiconductor region or channel. If thechannel is n-type (i.e., majority carriers are electrons), then the FETmay be referred to as a n-type FET. If the channel is p-type (i.e.,majority carriers are holes), then the FET may be referred to as ap-type FET. The channel may be capped by an insulating gate oxide. Thechannel conductivity may be controlled by applying a voltage to thegate. For example, applying a positive voltage or negative voltage to ann-type FET or a p-type FET, respectively, may result in the channelbecoming conductive. A transistor may be “on” or “activated” when avoltage greater than or equal to the transistor's threshold voltage isapplied to the transistor gate. The transistor may be “off” or“deactivated” when a voltage less than the transistor's thresholdvoltage is applied to the transistor gate.

The description set forth herein, in connection with the appendeddrawings, describes example configurations and does not represent allthe examples that may be implemented or that are within the scope of theclaims. The term “exemplary” used herein means “serving as an example,instance, or illustration,” and not “preferred” or “advantageous overother examples.” The detailed description includes specific details forthe purpose of providing an understanding of the described techniques.These techniques, however, may be practiced without these specificdetails. In some instances, well-known structures and devices are shownin block diagram form in order to avoid obscuring the concepts of thedescribed examples.

In the appended figures, similar components or features may have thesame reference label. Further, various components of the same type maybe distinguished by following the reference label by a dash and a secondlabel that distinguishes among the similar components. If just the firstreference label is used in the specification, the description isapplicable to any one of the similar components having the same firstreference label irrespective of the second reference label.

Information and signals described herein may be represented using any ofa variety of different technologies and techniques. For example, data,instructions, commands, information, signals, bits, symbols, and chipsthat may be referenced throughout the above description may berepresented by voltages, currents, electromagnetic waves, magneticfields or particles, optical fields or particles, or any combinationthereof.

The various illustrative blocks and modules described in connection withthe disclosure herein may be implemented or performed with ageneral-purpose processor, a DSP, an ASIC, an FPGA or other programmablelogic device, discrete gate or transistor logic, discrete hardwarecomponents, or any combination thereof designed to perform the functionsdescribed herein. A general-purpose processor may be a microprocessor,but in the alternative, the processor may be any conventional processor,controller, microcontroller, or state machine. A processor may also beimplemented as a combination of computing devices (e.g., a combinationof a digital signal processor (DSP) and a microprocessor, multiplemicroprocessors, one or more microprocessors in conjunction with a DSPcore, or any other such configuration).

The functions described herein may be implemented in hardware, softwareexecuted by a processor, firmware, or any combination thereof. Ifimplemented in software executed by a processor, the functions may bestored on or transmitted over as one or more instructions or code on acomputer-readable medium. Other examples and implementations are withinthe scope of the disclosure and appended claims. For example, due to thenature of software, functions described above can be implemented usingsoftware executed by a processor, hardware, firmware, hardwiring, orcombinations of any of these. Features implementing functions may alsobe physically located at various positions, including being distributedsuch that portions of functions are implemented at different physicallocations. Also, as used herein, including in the claims, “or” as usedin a list of items (for example, a list of items prefaced by a phrasesuch as “at least one of” or “one or more of”) indicates an inclusivelist such that, for example, a list of at least one of A, B, or C meansA or B or C or AB or AC or BC or ABC (i.e., A and B and C).

Computer-readable media includes both non-transitory computer storagemedia and communication media including any medium that facilitatestransfer of a computer program from one place to another. Anon-transitory storage medium may be any available medium that can beaccessed by a general purpose or special purpose computer. By way ofexample, and not limitation, non-transitory computer-readable media cancomprise RAM, ROM, electrically erasable programmable read only memory(EEPROM), compact disk (CD) ROM or other optical disk storage, magneticdisk storage or other magnetic storage devices, or any othernon-transitory medium that can be used to carry or store desired programcode means in the form of instructions or data structures and that canbe accessed by a general-purpose or special-purpose computer, or ageneral-purpose or special-purpose processor. Also, any connection isproperly termed a computer-readable medium. For example, if the softwareis transmitted from a website, server, or other remote source using acoaxial cable, fiber optic cable, twisted pair, digital subscriber line(DSL), or wireless technologies such as infrared, radio, and microwave,then the coaxial cable, fiber optic cable, twisted pair, digitalsubscriber line (DSL), or wireless technologies such as infrared, radio,and microwave are included in the definition of medium. Disk and disc,as used herein, include CD, laser disc, optical disc, digital versatiledisc (DVD), floppy disk and Blu-ray disc where disks usually reproducedata magnetically, while discs reproduce data optically with lasers.Combinations of the above are also included within the scope ofcomputer-readable media.

The description herein is provided to enable a person skilled in the artto make or use the disclosure. Various modifications to the disclosurewill be readily apparent to those skilled in the art, and the genericprinciples defined herein may be applied to other variations withoutdeparting from the scope of the disclosure. Thus, the disclosure is notlimited to the examples and designs described herein, but is to beaccorded the broadest scope consistent with the principles and novelfeatures disclosed herein.

What is claimed is:
 1. A method, comprising: accessing a memory cell ofa first portion of a memory array during an access operation, wherein afirst number of memory cells in the first portion of the memory arraycomprises an integer multiple of a second number of memory cells in asecond portion of the memory array that includes at least one cellredundant to the memory cell of the first portion of the memory array;selecting a shunt control line during the access operation based atleast in part on the memory cell of the first portion of the memoryarray that is accessed; and isolating a memory cell of the secondportion of the memory array during the access operation, wherein thememory cell of the second portion of the memory array is isolated basedat least in part on accessing the memory cell of the first portion ofthe memory array, wherein isolating the memory cell of the secondportion of the memory array during the access operation comprisescoupling the shunt control line with a virtual ground.
 2. The method ofclaim 1, further comprising: selecting the shunt control line during theaccess operation based at least in part on the memory cell of the firstportion of the memory array that is accessed.
 3. The method of claim 2,further comprising: isolating a set of memory cells of the first portionof the memory array during the access operation, wherein the set ofmemory cells is isolated based at least in part on the shunt controlline selected.
 4. The method of claim 3, further comprising: selecting aswitching component coupled with the shunt control line, wherein theisolation of the set of memory cells of the first portion is based atleast in part on the selection of the switching component.
 5. The methodof claim 2, further comprising: accessing a second memory cell of thesecond portion of the memory array based at least in part on the shuntcontrol line selected.
 6. A method, comprising: accessing a memory cellof a first portion of a memory array during an access operation, whereina first number of memory cells in the first portion of the memory arraycomprises an integer multiple of a second number of memory cells in asecond portion of the memory array that includes at least one cellredundant to the memory cell of the first portion of the memory array;comparing an identifier of the memory cell of the first portion of thememory array to an array mapping index that associates each memory cellof the first portion of the memory array with a memory cell of thesecond portion of the memory array; determining a shunt control line toselected based at least in part on the comparison; selecting the shuntcontrol line during the access operation based at least in part on thememory cell of the first portion of the memory array that is accessed;and isolating the memory cell of the second portion of the memory arrayduring the access operation, wherein the memory cell of the secondportion of the memory array is isolated based at least in part onaccessing the memory cell of the first portion of the memory array. 7.The method of claim 6, further comprising: selecting the shunt controlline during the access operation based at least in part on the memorycell of the first portion of the memory array that is accessed.
 8. Themethod of claim 7, further comprising: isolating a set of memory cellsof the first portion of the memory array during the access operation,wherein the set of memory cells is isolated based at least in part onthe shunt control line selected.
 9. The method of claim 8, furthercomprising: selecting a switching component coupled with the shuntcontrol line, wherein the isolation of the set of memory cells of thefirst portion is based at least in part on the selection of theswitching component.
 10. The method of claim 7, further comprising:accessing a second memory cell of the second portion of the memory arraybased at least in part on the shunt control line selected.
 11. Anapparatus, comprising: a first portion of a memory array comprising afirst number of memory cells; a second portion of the memory arraycomprising a second number of memory cells, wherein the second portionfurther comprises at least one memory cell redundant to a memory cell ofthe first portion, wherein the first number of memory cells is aninteger multiple of the second number of memory cells; an access linecoupled with at least one memory cell of the first number of memorycells and at least one memory cell of the second number of memory cells,wherein the access line is configured to isolate a memory cell of thesecond portion of the memory array during an access operation; a firstset of switching components coupled with the first portion of the memoryarray and the access line, wherein the access line is configured toisolate the memory cell of the second portion of the memory array basedat least in part on a configuration of the first set of switchingcomponents; a second set of switching components coupled with the secondportion of the memory array and the access line, wherein the access lineis configured to isolate the memory cell of the second portion of thememory array based at least in part on the configuration of the firstset of switching components and a configuration of the second set ofswitching components; a subset of the first set of switching components;and a subset of the second set of switching components coupled with avirtual ground, wherein the subset of the second set of switchingcomponents is configured to couple the memory cell of the second portionof the memory array with the virtual ground.
 12. The apparatus of claim11, wherein the access line is configured to isolate the memory cell ofthe second portion of the memory array during the access operation basedat least in part on a selection of the memory cell of the first portionof the memory array during the access operation.
 13. The apparatus ofclaim 11, wherein the access line comprises a shunt control line.
 14. Anapparatus, comprising: a first portion of a memory array comprising afirst number of memory cells; a second portion of the memory arraycomprising a second number of memory cells, wherein the second portionfurther comprises at least one memory cell redundant to a memory cell ofthe first portion, wherein the first number of memory cells is aninteger multiple of the second number of memory cells; an access linecoupled with at least one memory cell of the first number of memorycells and at least one memory cell of the second number of memory cells,wherein the access line is configured to isolate a memory cell of thesecond portion of the memory array during an access operation; a firstset of switching components coupled with the first portion of the memoryarray and the access line, wherein the access line is configured toisolate the memory cell of the second portion of the memory array basedat least in part on a configuration of the first set of switchingcomponents; and a second set of switching components coupled with thesecond portion of the memory array and the access line, wherein theaccess line is configured to isolate the memory cell of the secondportion of the memory array based at least in part on the configurationof the first set of switching components and a configuration of thesecond set of switching components, wherein the first set of switchingcomponents is configured to connect the memory cell of the first portionof the memory array to a virtual ground or a sense component and thesecond set of switching components is configured to connect the memorycell of the second portion to the virtual ground or the sense component.15. The apparatus of claim 14, wherein the access line is configured toisolate the memory cell of the second portion of the memory array duringthe access operation based at least in part on a selection of the memorycell of the first portion of the memory array during the accessoperation.
 16. The apparatus of claim 14, wherein the access linecomprises a shunt control line.
 17. An apparatus, comprising: a memorycell comprising a ferroelectric capacitor; an access line coupled witheach of a first portion of a memory array and a second portion of thememory array; a switching component coupled with the access line; and amemory controller in electronic communication with the memory cell,wherein the memory controller is operable to: select a memory cell ofthe first portion of the memory array before an access operation;compare an identifier of the memory cell of the first portion of thememory array to an array mapping index, wherein the array mapping indexassociated each memory cell of the first portion of the memory arraywith a memory cell of the second portion of the memory array; select theaccess line coupled with each of the first portion of the memory arrayand the second portion of the memory array during the access operationbased at least in part on the comparison, wherein the selection of theaccess line is based at least in part on the selection of the memorycell of the first portion of the memory array; access the memory cell ofthe first portion of the memory array during the access operation,wherein a first number of memory cells in the first portion of thememory array comprises an integer multiple of a second number of memorycells in the second portion of the memory array that includes at leastone cell redundant to a cell of the first portion of the memory array;and isolate the memory cell of the second portion of the memory arrayduring the access operation, wherein the memory cell of the secondportion of the memory array is isolated based at least in part onaccessing the memory cell of the first portion of the memory array,wherein the isolation of the memory cell of the second portion is basedat least in part on the memory controller activating the switchingcomponent.
 18. An apparatus, comprising: a memory cell comprising aferroelectric capacitor; a plurality of access lines coupled with eachof a first portion of a memory array and a second portion of the memoryarray; a plurality of switching components coupled with each of theplurality of access lines, wherein each of the plurality of switchingcomponents is coupled with a virtual ground; and a memory controller inelectronic communication with the memory cell, wherein the memorycontroller is operable to: access a memory cell of the first portion ofthe memory array during an access operation, wherein a first number ofmemory cells in the first portion of the memory array comprises aninteger multiple of a second number of memory cells in the secondportion of the memory array that includes at least one cell redundant toa cell of the first portion of the memory array; and isolate a memorycell of the second portion of the memory array during the accessoperation, wherein the memory cell of the second portion of the memoryarray is isolated based at least in part on accessing the memory cell ofthe first portion of the memory array, wherein the isolation of thememory cell of the second portion is based at least in part on thememory controller activating at least one of the plurality of switchingcomponents coupled with the virtual ground.